Backside Absorbing Layer Microscopy: Monolayer Counting in 2D Crystal Flakes

Dominique Ausserré (1) , Refahi Abou Khachfe (2) , Takashi Taniguchi (3) , Kenji Watanabe (3) , Fabien Vialla (4, 5)

1 IMMM - Institut des Molécules et Matériaux du Mans
2 Lebanese university, Faculty of technology
3 NIMS - National Institute for Materials Science
4 ILM - Institut Lumière Matière [Villeurbanne]
5 UCBL FS - Université Claude Bernard Lyon 1 - Faculté des sciences

Domaines: Physique [physics]

Dominique Ausserré, Refahi Abou Khachfe, Takashi Taniguchi, Kenji Watanabe, Fabien Vialla. Backside Absorbing Layer Microscopy: Monolayer Counting in 2D Crystal Flakes. physica status solidi (b), 2023, ⟨10.1002/pssb.202300068⟩. ⟨hal-03858429v1⟩