Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength

Christian Traum (1) , Patricia Loren-Inacio (1) , Corinne Felix (2) , Patricia Segonds (1) , Alexandra Pena (1) , Jérome Debray (3) , Benoit Boulanger (1) , Yannick Petit (4) , Daniel Rytz (5) , G. Montemezzani (6) , Alban Ferrier (7) , Philippe Goldner (7)

1 NEEL - OPTIMA - Optique et Matériaux
2 NEEL - POM - Optique & Microscopies
3 NEEL - CrisMass - Cristaux massifs
4 ICMCB - Institut de Chimie de la Matière Condensée de Bordeaux
5 FEE Gmbh
6 LMOPS - Laboratoire Matériaux Optiques, Photonique et Systèmes
7 LCMCP - Laboratoire de Chimie de la Matière Condensée de Paris

We report a method based on Malus' law to directly measure the dielectric frame orientation of monoclinic crystals with an accuracy of 0.3°. This technique was validated by the study of Nd3+:YCa4O(BO3)3, Sn2P2S6, BiB3O6 and Eu3+:Y2SiO5

Mots clés: Crystals; Measurements; Dielectrics

Domaines: Science des matériaux [cond-mat.mtrl-sci]; Optique [physics.optics]

Christian Traum, Patricia Loren-Inacio, Corinne Felix, Patricia Segonds, Alexandra Pena, et al.. Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength. Optical Materials Express, 2014, 4 (1), pp.57-62. ⟨10.1364/OME.4.000057⟩. ⟨hal-00931889⟩