Analytic modeling of breakdown voltage shift in the CMOS buried multiple junction detector

Document type :
Journal articles
Complete list of metadatas

https://hal-univ-lyon1.archives-ouvertes.fr/hal-02463250
Contributor : Pascal Kleimann <>
Submitted on : Friday, January 31, 2020 - 6:21:10 PM
Last modification on : Saturday, February 1, 2020 - 1:49:30 AM

Identifiers

Collections

Citation

Thais Luana Vidal de Negreiros da Silva, Pascal Kleimann, Patrick Pittet, Guo-Neng Lu. Analytic modeling of breakdown voltage shift in the CMOS buried multiple junction detector. Solid-State Electronics, Elsevier, 2020, 164, pp.107682. ⟨10.1016/j.sse.2019.107682⟩. ⟨hal-02463250⟩

Share

Metrics

Record views

17