Analytical requirements for quantitative X-ray fluorescence nano-imaging of metal traces in solid samples

Laurence Lemelle 1 Alexandre Simionovici Tom Schoonjans Rémi Tucoulou Emanuele Enrico Murielle Salomé Axel Hofmann Barbara Cavalazzi
1 LGL-TPE - Laboratoire de Géologie de Lyon - Terre, Planètes, Environnement [Lyon]
Abstract : Quantitative nano-imaging of metal traces in a solid is a recent capability arising from the construction of hard X-ray nanoprobes dedicated to X-ray Fluorescence (XRF) imaging on upgraded third generation synchrotrons. Micrometer sample preparation valid for trace analysis is a fundamental part of the required developments to capitalize on the reduced Minimum Detection Limits. Practical guidelines lead us to propose a customized use of Focused Ion Beams (FIB) backed by state of the art Monte Carlo XRF modeling to initiate preparations of new samples and certified standards. The usefulness of these developments is illustrated by the first detection of Ni traces (4.57E+07~\textpm~3.2E+06 (7.1%) at μm-3) in a 3.35 Ga old microstructure of putative microbial origin from Barberton (South Africa). A list of feasibility checks provides a way of getting below 5~ppm MDLs for acquisition-times of 10~s with an analytical precision better than 10%.
Keywords : Archaean fossils Barberton FIB Hard X-ray nanoprobe Metal traces Nano-imaging Synchrotron XRF X-ray Monte Carlo modeling
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Journal articles
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https://hal-univ-lyon1.archives-ouvertes.fr/hal-02358945
Contributor : Depot 2 Lyon 1 <>
Submitted on : Tuesday, November 12, 2019 - 11:30:46 AM
Last modification on : Tuesday, February 18, 2020 - 3:54:03 PM

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UNIV-LYON1 | LGL-TPE | ENS-LYON | CNRS | INSU | UDL

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Laurence Lemelle, Alexandre Simionovici, Tom Schoonjans, Rémi Tucoulou, Emanuele Enrico, et al.. Analytical requirements for quantitative X-ray fluorescence nano-imaging of metal traces in solid samples. TrAC Trends in Analytical Chemistry, 2017, 91, pp.104--111. ⟨10.1016/j.trac.2017.03.008⟩. ⟨hal-02358945⟩

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