Skip to Main content Skip to Navigation
Journal articles

Radioluminescence Sensitization in Scintillators and Phosphors: Trap Engineering and Modeling

Abstract : The role of charge carrier trapping in determining radioluminescence (RL) efficiency increase during prolonged irradiation of scintillators has been studied by using YPO4:Ce,Nd as a model material. The Nd3+ ions act as efficient electron traps minimizing the role of intrinsic defects. Different Nd contents were considered in order to point out the correlation between the trap concentration and the detected RL efficiency dose dependence. RL measurements as a function of temperature clarified the role of the trap thermal stability in determining the shape and the magnitude of such effect. We propose also a model based on trap filling which is able to describe accurately the complex processes which are involved.
Document type :
Journal articles
Complete list of metadatas

https://hal-univ-lyon1.archives-ouvertes.fr/hal-02309838
Contributor : Depot 4 Lyon 1 <>
Submitted on : Wednesday, October 9, 2019 - 4:10:39 PM
Last modification on : Thursday, October 15, 2020 - 8:54:04 AM

Identifiers

Collections

Citation

Federico Moretti, Gaël Patton, Andrei Belsky, M. Fasoli, A. Vedda, et al.. Radioluminescence Sensitization in Scintillators and Phosphors: Trap Engineering and Modeling. Journal of Physical Chemistry C, American Chemical Society, 2014, 118, pp.9670-9676. ⟨10.1021/jp501717z⟩. ⟨hal-02309838⟩

Share

Metrics

Record views

257