Fabrication and characterization of a focused ion beam milled lanthanum hexaboride based cold field electron emitter source

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Submitted on : Tuesday, September 17, 2019 - 10:59:13 AM
Last modification on : Monday, September 30, 2019 - 1:48:10 PM

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G. Singh, R. Bucker, G. Kassier, M. Barthelmess, F. S. Zheng, et al.. Fabrication and characterization of a focused ion beam milled lanthanum hexaboride based cold field electron emitter source. Applied Physics Letters, American Institute of Physics, 2018, 113, pp.093101. ⟨10.1063/1.5039441⟩. ⟨hal-02289871⟩

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