Noise Modeling For Charge Amplification and Sampling

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https://hal-univ-lyon1.archives-ouvertes.fr/hal-02000845
Contributor : Laurent Quiquerez <>
Submitted on : Wednesday, January 30, 2019 - 6:54:58 PM
Last modification on : Friday, March 8, 2019 - 11:20:57 AM

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  • HAL Id : hal-02000845, version 1

Citation

Patrick Pittet, Guo-Neng Lu, Laurent Quiquerez. Noise Modeling For Charge Amplification and Sampling. 2006 13th IEEE International Conference on Electronics, Circuits and Systems, Dec 2006, Nice, France. pp.9-12. ⟨hal-02000845⟩

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